Scanning acoustic microscopy (SAM) is a consolidated and recognized tool for quality control, inspection and failure analysis of microelectronic components and materials. This inspection technique is routinely used for the non-destructive detection of internal anomalies (cracks, voids and delamination, porosity, hermeticity issues…) impairing the system performance. Thus, it is a mandatory acceptance test for the implementation of plastic microelectronic parts in critical systems. Our lab gathers a qualified (Ph.D., M.Sc.) and multidisciplinary team specialized in different disciplines such as Materials Science, Physics, Electronics, and Aerospace Engineering; together with a highly experienced technical staff with a solid background in microscopy, materials analysis and EEE inspection. This team is supported by more than 30 years of experience of Alter Technology in EEE testing and engineering.

Applications and Services
  • Ceramic capacitors
    • MIL-PRF-123
    • MIL-PRF-31033
    • MIL-PRF-49470
  • Hermetic packages
    • Die attach and lid-seal inspections
Virtual Lab features
  • Full access in real time to the output of the on-going test.
  • Easy image review thanks to our filtering engine.
  • Permanent access to historical results.
  • Full access to high quality images.
  • Training material.
  • Documentation management.
  • Push Notifications.