Scanning acoustic microscopy (SAM) is a consolidated and recognized tool for quality control, inspection and failure analysis of microelectronic components and materials. This inspection technique is routinely used for the non-destructive detection of internal anomalies (cracks, voids and delamination, porosity, hermeticity issues…) impairing the system performance. Thus, it is a mandatory acceptance test for the implementation of plastic microelectronic parts in critical systems. Our lab gathers a qualified (Ph.D., M.Sc.) and multidisciplinary team specialized in different disciplines such as Materials Science, Physics, Electronics, and Aerospace Engineering; together with a highly experienced technical staff with a solid background in microscopy, materials analysis and EEE inspection. This team is supported by more than 30 years of experience of Alter Technology in EEE testing and engineering.